Session 6 (Plenary session)
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D. Pudiš, L. Šušlik, I. Martinček, J. Kováč, J. Kováč jr., J. Jakabovič
Laser structure characterization using NOBIC
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Ľ. Stuchlíková, D. Búc, L. Harmatha, M. Benkovič
<![CDATA[ Investigation of deep levels in 4H-SiC/ RuO<sub>2</sub> Schottky barrier structure
irradiated by fast electrons by DLFTS method ]]>
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P. Kordoš, M. Florovič, R. Stoklas, D. Gregušova, D. Donoval
<![CDATA[ Characterization of Al<sub>2</sub>O<sub>3</sub>/AlGaN/GaN MOSHFETs AND AlGaN/GaN HFET by measurements at elevated temperatures ]]>
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A. Chvála, D. Donoval, P. Beňo, J. Marek, T. Košík
Extraction of the critical temperature limit for ESD protection device
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B. Zaťko, F. Dubecký, J. Přibil, J. Mudroň
On current development of quantum imaging X–CT system using GAAS radiation detectors