Session 4(B) S. Jurečka, E. Pinčík, H. Kobayashi, M. Takahashi <![CDATA[ Microstructural and optical properties of Si/a-SiC:H/SiO<sub>2</sub> thin films ]]> J. Kováč jr., V. Gottschalch , J. Kováč, B. Rheilnänder, J. Škriniarová, J. Jakabovič, D. Haško, J. Chovan, M. Predanocy Optical characterization of RCE optoelectronic devices I. Turek, N. Tarjányi, D. Káčik Refractive index determination using a low-coherence interferometry J. Štelina, C. Musil The effect of light polarization on the decay of the thermoparticle grating in magnetic fluid V. Nádaždy, R. Durný, M. Weis, J. Jakabovič Defect states in pentacene thin films prepared by thermal evaporation and Langmuir-Blodgett technique J. Jakabovič, J. Kováč, R. Srnánek, J. Kováč jr., D. Haško, M. Sokolský, J. Cirák Pentacene OTFT gate dielectric modification P. Bokes Scattering of electrons from an edge and the spin Hall effect