<?xml version="1.0" encoding="windows-1250" ?>
<?xml-stylesheet type="text/css" href="../css/session.css" ?>
<response>

<title>Session 4(A)</title>
<chman>Chairman: D. Donoval</chman>
<item>
<author>M. Daříček, M. Donoval, A. Šatka, D. Donoval</author>
<title>Characterization of MagFET structures in alternating magnetic field</title>
</item>
<item>
<author>J. Marek, D. Donoval, M. Donoval, M. Daříček, M. Mikolášek</author>
<title>Analysis of Novel Vertical MagFET Structures for Built-in Current Sensors Supported by 2D Modeling and Simulation </title>
</item>
<item>
<author>L. Harmatha, P. Ballo, M. Ťapajna, O. Csabay, M. Nemec</author>
<title>The effect of high temperature annealing on the properties of MOS structures on nitrogen doped silicon</title>
</item>
<item>
<author>A. Chvála, D. Donoval, P. Beňo, J. Marek</author>
<title>Optimization of the geometry of ESD protection device</title>
</item>
<item>
<author>M. Krajmer, J. Racko, D. Ďuračková, J. Breza, A. Grmanová, M. Kadlečíková</author>
<title>Modelling of a pseudo floating gate transistor</title>
</item>
<item>
<author>M. Žiška</author>
<title>Effect of some swift heavy ions irradiation on MOS structure properties - summary</title>
</item>
<item>
<author>R. Kinder, R. Srnanek, B. Ściana, D. Radziewicz, G. Brammertz, J. Goossens, T. Clarysse, A. Vincze</author>
<title>Progress in dopant and carrier profiling in GaAs structures</title>
</item>
<item>
<author>M. Sumega, V. Áč </author>
<title>Study of PtSi/TiW vs. PtSi/TiTiN contact structures</title>
</item>

</response>
