Electrical Measurements II
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M. Florovič, J. Kováč, J. Škriniarová, T. Lalinský, Š. Haščík, P. Kordoš, D. Donoval, R. Kinder, M.Tomáška
Electrical properties of Al0.3Ga0.7N/GaN heterostructure field effect transistor
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K. Rendek, A. Šatka, J. Kováč, D. Donoval
Investigation of low-frequency noise in HEMT transistors
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W. Macherzyński, B. Paszkiewicz, R. Paszkiewicz, M. Tłaczała
Ohmic contacts to n-type AlGaN/GaN heterostructures
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M. Varga, M. Vojs, M. Marton, L. Michalíková, M. Veselý, R. Redhammer, M. Michalka
Substrate seeding by ultrasonication with diamond powder and diamond film growth
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M. Vojs, E. Šipoš, V. Řeháček, M. Marton, M. Varga, M. Veselý
A study of bismuth-film electrodes for the determination of trace metals by anodic stripping voltammetry